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AS1123
Datasheet - D e t a i l e d D e s c r i p t i o n
Detailed Shorted-LED Error Report
The detailed shorted-LED error report can be read out immediately after global error mode has been run (see Global Error Mode on page 10) .
SDI must be 1 for the first device.
Figure 16. Detailed Shorted-LED Error Report Timing Diagram
OEN
Global Flag Readout
t TESTING
Detailed Error Report Readout
LD
t SU(ERROR)
t H(L)
CLK
t GSW(ERROR)
t GSW(ERROR)
t GSW(ERROR)
t P4
SDI
DBit15
DBit14 DBit13 DBit12
DBitn
DBit2
DBit1
DBit0
Don’t
Care
t SW(ERROR)
New Data Input
SDO
T FLAG O FLAG
S FLAG
SBit15
SBit14 SBit13 SBit12
SBitn
SBit2
SBit1
SBit0
Don’t
Care
t P4
Shorted-LED Error Report Output
t P1
For detailed timing information see Timing Diagrams on page 8 .
Detailed Shorted-LED Error Report Example
Consider a case where three AS1123s are cascaded in one chain. A 1 indicates a LED is on, a 0 indicates a LED is off, and an X indicates a
shorted LED. This test is used on-the-fly.
IC1:[11111XX111111111] IC2:[1111111111111111] IC3:[X100011111111111]
IC1 has two shorted LEDs which are switched on, IC3 has one shorted LED switched off due to input. 3*16 clock cycles are needed to write the
entire error code out. The detailed error report would look like this:
Input Data:
LED Status:
Failure Code:
1111111111111111
11111XX111111111
1111100111111111
1111111111111111
1111111111111111
1111111111111111
0100011111111111
X1 1 1 1 1 1 1 1 1 1 1 1 1 1 1
1111111111111111
Showing IC1 as the device with two shorted LEDs at position 6 and 7, and IC3 with one shorted LED at position 1. The shorted LED at position 1
of IC3 cannot be detected, since LEDs turned off at test time are not tested and will show a logic "1" at the detailed error report. To test all LEDs
this test should be run with an all 1s test pattern. For a test with an all on test pattern, low-current diagnostic mode should be entered first to
reduce on-screen flickering.
Note: In an actual report there are no spaces in the output. LEDs turned off during test time cannot be tested and will show a logic 1 in the
detailed error report.
Low-Current Diagnostic Mode
To run the open- or shorted-LED test, a test pattern must be used that will turn on each LED to be tested. This test pattern will cause a short
flicker on the screen while the test is being performed. The low-current diagnostic mode can be initiated prior to running a detailed error report to
reduce this on-screen flickering.
Note: Normally, displays using such a diagnostic mode require additional cables, resistors, and other components to reduce the current. The
AS1123 has this current-reduction capability built-in, thereby minimizing the number of external components required.
Low-current diagnostic mode can be initiated via 3 clock pulses during error-detection mode. After the falling edge of LD, a test pattern displaying
all 1s can be written to the shift register which will be used for the next error-detection test.
On the next falling edge of OEN, current is reduced to I LC . With the next rising edge of OEN the current will immediately increase to normal lev-
els and the detailed error report can be read out entering error-detection mode.
www.austriamicrosystems.com/LED-Driver-ICs
Revision 1.00
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